Abstract
With the advent of the System On a Chip (SoC) and mass production of these complex ICs, design of an ASIC with testability features in it has become a mandatory requirement. Testability requirements are present in various levels of an SoC. The internal gates of the chip should be made testable for stuck-at faults. Internal hard-macros need to be tested for manufacturing defects. The connection of the pads with the external pins are to be tested for bonding faults. Chips placed on boards are to be tested for the pin connection integrity on the board. Different methods are used to test each of these defects.

This paper discusses various design / implementation issues typically need to be consid-ered for designing a circuitry for testability, achieving high test coverage in less test time. WIPRO’s synthesizable core for OHCI (Open Host Controller Interface) over IEEE 1394 Link layer implementation is used as a reference in this paper.

Author Sukalyan Mukherjee

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