Hybrid test methodology

Abstract
As the complexity of VLSI design and manufacturing process increases rapidly, importance of manufacturing test becomes more critical. The main requirements of an effective Manufacturing Test methodology are, support for detection of all kind of manufacturing defects, minimal hardware overhead and minimum test execution time. In the current deep sub-micron era, smaller geometry and high density of transistors creates new kind of faults which demands for fundamental change in test methodology and fault models. Conventional test methods do not address these requirements well. Advances in EDA technology as well as architectural and design level considerations, and innovative way of implementation are the need of the day.

This paper covers a brief on conventional test methods, their limitations, and the need for new kind of test methodology. It discusses the limitations of Automatic Test Equipment as well as the need for BIST architectures . Finally it discuss about the need and the power of innovative Hybrid-Test Methodology and Hybrid Test Architecture to overcome the problems of Deep Sub micron Devices.

Authors Sanjay JK Sabeesh Balagangadharan Rajin Ravimony Sasitharan M

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