Abstract
Lack of co-relation between expected circuit performance from library characterization values and actual silicon behavior is getting more critical with the blame being put on process variation, variable IR drop , temperature and voltage variation. This is due to multiple reasons that are been discussed now a days in the industry including deep sub micron issues , power distribution, variation in manufacturing process etc. Thus more emphasis is now on the EDA tools capability to model and analyze the above issues.

With the gamut of physics working against the VLSI engineer the most critical aspect of timing performance is a mystery before the silicon the tested for performance.

Using PrimeTime we can model all these issue in terms of OCV (On-chip variation) analysis feature. This paper aims at describing the following:

	Why OCV analysis is required?
	How to perform OCV analysis using PrimeTime?
	What is CRPR ?
	Issue with the tool while using variable CRPR ?
	Effective use of CRPR

Authors
Sandeep Kolte
Sabeesh Balagangadharan
Vikas Mahendiyan

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